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Thin Film Measurement
We developed, in cooperation with leading manufacturers, a wide range of optical thin-film metrology instruments from high-precision sophisticated ellipsometry and reflectometry systems (spectroscopic, fast single wavelength and Imaging) for research and production applications to low-budget reflectometers for variety of applicationsThin Film Measurement system
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Approx. Rs 10 Lakh / PieceGet Latest Price
Product Details:| Usage/Application | Laboratory |
| Size | Medium |
| Color | Black |
| I Deal In | New Only |
| Country of Origin | Made in India |
| TFCompanion is a powerful and user friendly software application for thin film analysis and metrology.It combines versatile analytical tools for interpretation of measurement data - to determine actual physical parameters of a filmstack (like thicknesses of the layers and optical properties of the materials). It allows simulation and sensitivity analysis to understand better why the things are the way they are. TFCompanion gives the ability to estimate measurement/calculation errors, create and optimize measurement recipes and mitigate tradeoffs between measurement accuracy and thruput. |
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Ellipsometer Systems ,
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Approx. Rs 10 Lakh / PieceGet Latest Price
Product Details:| Lamp Option | 150W |
| Categories | Examination Equipments |
| Color | White |
| Display | Digital |
| Country of Origin | Made in India |
Ellipsometry is a nondestructive and highly sensitive optical measurement technique used to analyze thin-layer stacks. It is based on the observation that polarized light reflected from the surface with thin layer is changing polarization state, e.g. linearly polarized light will, in general case, change to elliptically polarized - hence, the name "ellipsometry". This change of polarization state can be related to optical thickness of the layer(s).
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M - probe Series
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Approx. Rs 15 Lakh / PieceGet Latest Price
Product Details:| Usage/Application | Laboratory |
| I Deal In | New Only |
| width | 3 m |
| size | Around 1mm diameter |
| Measurements | for 20 days |
| length | 10 m |
M-Probe series thin-film measurement system is based on a fiber optics backscattering reflection or transmittance probe.Small, precise, easy to use and low-budget instrument used for in-situ and ex-situ (desktop) measurements - it is a real workhorse in research lab and production
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TAPAN SHARDA (DIRECTOR)
New Age Instruments & Materials Private Limited
New Age Instruments & Materials Private Limited
12-15, Apna Enclave Shopping Complex,
Railway Road,Sector 3
Gurgaon - 122001, Gurugram, Haryana, India
Gurgaon - 122001, Gurugram, Haryana, India
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